PRRS 2020

The International Association for Pattern Recognition (IAPR) Technical Committee 7 (TC-7 Remote Sensing – organizes the 11th IAPR International Workshop on Pattern Recognition in Remote Sensing (PRRS 2020). This workshop is held in conjunction with the International Conference on Pattern Recognition (ICPR 2020) ( The workshop is sponsored by IAPR and International Society for Photogrammetry and Remote Sensing (ISPRS).

Aims and Scope

As one of the flagship events of the International Association for Pattern Recognition, Pattern Recognition in Remote Sensing Workshop serves as an event bringing together researchers from both pattern recognition and
remote sensing, with emphasis on the application of pattern recognition methods to remotely sensed data. The steady progress in the development of new remote sensing devices and remote sensing technology has led to ever increasing data and new challenges. Thus, need arises to apply the latest methods of machine learning and pattern recognition for automated analysis of this kind of data. This workshop will provide an ideal forum for spreading and exchanging the latest experiences of international researchers. Topics might be related to a large range of topics, including, but not limited to:
– Semantic classification and parameter estimation from hyperspectral and multispectral images
– Extraction, selection, learning, and reduction of features
– Deep learning for Earth observation data
– Clustering
– Active and transfer learning
– Multi-modal and multi-temporal analysis
– Image analysis of SAR and airborne thermal data
– Recognition of man-made objects such as buildings and roads from aerial and space platforms
– Novel pattern recognition tasks in remote sensing applications
– Technical reviews on related topics

Submission guidelines

Authors are invited to submit full papers (max. 6 pages), which should adhere to the ICPR conference submission guidelines regarding the paper format. All manuscripts will be subject to a single-blind review process. Accepted papers that were presented at the workshop are submitted to IEEE for possible publication in IEEE Xplore. Publication in IEEE Xplore will be granted only if the paper meets IEEE publication policies and procedures. By submitting a manuscript, the authors guarantee that it has not been previously published or accepted for publication in substantially similar form. Furthermore, no paper which contains significant overlap with the contributions of this paper either is under review at the moment of submission or will be submitted during the review period to any other conference, workshop or journal. A special issue associated to this workshop is planned later on.

Submission website: coming soon

Call for Papers

Please download the call for papers here.

Important Dates

Workshop submission deadline: June 15, 2020
Workshop author notification: July 15, 2020
Camera-ready submission: July 30, 2020
Finalized workshop program: August 15, 2020
Workshop (full-day): September 13, 2020


Ribana Roscher, University of Bonn, Germany
Jie Shan, Purdue University, USA
Eckart Michaelsen, Fraunhofer-IOSB, Germany
Uwe Stilla, Technische Universitaet Muenchen, Germany

Program Committee

Gabriele Cavallaro, FZ Jülich, Germany
Jocelyn Chanussot, Grenoble Institute of Technology, France
Paolo Gamba, University of Pavia, Italy
Xiangyun Hu, Wuhan University, China
Michael Kampffmeyer, University of Tromsø, Norway
John Kerekes, Rochester Institute of Technology, USA
Sébastien Lefèvre, Université de Bretagne Sud / IRISA, France
Peijun Li, Peking University, China
Helmut Mayer, Bundeswehr University Munich, Germany
Farid Melgani, University of Trento, Italy
Gabriele Moser, University of Genoa, Italy
Franz Rottensteiner, Leibniz Universität Hannover, Germany
Michael Schmitt, DLR Munich, Germany
Xiaohua Tong, Tongji University, China
Michele Volpi, Swiss Data Science Center, Switzerland
Björn Waske, University of Osnabrueck, Germany
Jan Dirk Wegner, ETH Zurich, Switzerland
Martin Weinmann, Karlsruhe Institute of Technology, Germany
Lexie Yang, Oak Ridge National Laboratoy, USA
Xuezhi Yang, University of Waterloo, Canada
Alper Yilmaz, Ohio State University, USA